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The Rigaku ZSX Primus IVi offers high-speed chemical analysis of geological materials, liquids, alloys, chemicals, and plated metals. As a sequential WDXRF spectrometer, it delivers superior resolution and sensitivity compared to EDXRF spectrometers.
The system has been optimized for high-speed, automated analysis, making it ideal for industrial applications requiring rapid turnaround times. Improved mechanical and electronic designs have reduced dead-time and higher sample throughput. Increased throughput speeds are also aided by a Digital Multi-Channel Analyzer (D-MCA) system that provides high-speed processing for high count rates culminating in improved analytical precision.
Sample load times are also minimized using a vacuum partition system. This system reduces the time to transition the spectrometer chamber from vacuum to helium/nitrogen or vice versa. He consumption is reduced, resulting in lower running costs, especially compared to systems requiring the full spectrometer chamber to be purged.
A Smart Sample Loading System (SSLS) lets you load up to 138 specimens of different sizes and preparation forms. Trays can easily be removed from the spectrometer and taken to the sample preparation site, simplifying accessibility and handling. The SSLS can also be connected to an automated sample preparation system.
If the sample loading system goes off-line, manual sample loading can easily be performed, minimizing workflow interruptions.
Different collimator mask sizes (0.5 to 37 mm) allow the most diverse sample sizes to be handled easily.
The Rigaku ZSX Primus IVi also offers exceptional light element detection limits thanks to a 30 µm Be window on the X-ray tube, the thinnest commercially available, and specially developed analyzer crystals with dedicated 2 d values, to capture light element wavelengths.
For ultra-light elements (Be – O) and light elements with low energy X-Ray emissions (F – Al), the degree of vacuum greatly impacts X-Ray intensity. The APC (Automatic Pressure Control) maintains steady state vacuum conditions and facilitates reproducible X-ray intensities for these elements.
The ZSX Primus IVi also features Rigaku’s optical system that suppresses signal variations produced due to changes in the distance between the sample and detector. Causes for this include uneven or bowed sample surfaces due to sample pressing or thermal stresses from the fusion process. Minimizing the impact of shape effects helps to produce more accurate data and analyses.
While XRF is generally classified as a bulk analytical technique, The ZSX Primus IVi also allows for point mapping performance. Using a high-resolution camera, the user can easily zoom in on a specific feature of interest and carry out chemical analysis which is ideal for inhomogeneous samples such as minerals or alloy inclusions. This capability is enhanced by superior design using the shortest tube-to-sample distance to maximize intensity and thus sensitivity.
Through continuous refinements, Rigaku’s SQX analysis gets easier to use. It is a highly accurate method for determination of the elemental composition of your samples based on standardless FP analysis.
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